Atomically resolved transmission electron microscopy and in-situ voltage driven dynamic response of domain walls in lead-free ferroelectrics : doctoral dissertation; Presevna elektronska mikroskopija domenskih sten na atomski ravni in njihov in situ dinamični odziv na električno polje v feroelektrikih brez svinca : doktorska disertacija

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Atomically resolved transmission electron microscopy and in-situ voltage driven dynamic response of domain walls in lead-free ferroelectrics : doctoral dissertation = Presevna elektronska mikroskopija domenskih sten na atomski ravni in njihov in situ dinamični odziv na električno polje v feroelektrikih brez svinca : doktorska disertacija

Condurache, Oana

Type of material - dissertation ; adult, serious

Publication and manufacture - Ljubljana : [O.-A. Condurache], 2023

Language - english

COBISS.SI-ID - 165021443

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Other authors
Benčan, Andreja | Dražić, Goran | Šturm, Sašo | Ruiz-Zepeda, Francisco | Tileli, Vasiliki

Availability in libraries

Library/institution	City	Acronym	For loan	Other holdings
Jožef Stefan Institute, Ljubljana	Ljubljana	IJS	outside loan 1 cop.
National and University Library, Ljubljana	Ljubljana	NUK		in preparation 1 cop. not for loan 1 cop.

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Condurache, Oana	52039
Benčan, Andreja	19038
Dražić, Goran	02556
Šturm, Sašo	19030
Ruiz-Zepeda, Francisco	37779
Tileli, Vasiliki

Source: Personal bibliographies and: SICRIS

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