Ion beam analysis of geometrically structured samples : doctoral dissertation; Analiza geometrijsko strukturiranih vzorcev z ionskim žarkom : doktorska disertacija

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Ion beam analysis of geometrically structured samples : doctoral dissertation = Analiza geometrijsko strukturiranih vzorcev z ionskim žarkom : doktorska disertacija

Jezeršek, David

Type of material - dissertation ; adult, serious

Publication and manufacture - Ljubljana : [D. Jezeršek], 2011

Language - english

COBISS.SI-ID - 257786368

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Library/institution	City	Acronym	For loan	Other holdings
National and University Library, Ljubljana	Ljubljana	NUK		in preparation 1 cop. not for loan 1 cop.

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Jezeršek, David	28751
Šmit, Žiga	07716

Source: Personal bibliographies and: SICRIS

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