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  • Microstructure, crystalline orientation evolution and electromechanical properties of ▫$0.5Ba(Zr_{0.2}Ti_{0.8})O_3−0.5(Ba_{0.7}Ca_{0.3})TiO_3$▫ thin films on platinized sapphire [Elektronski vir]
    Konsago, Sabi William ...
    The microstructure and crystalline orientation evolution of manganese-doped 0.5Ba(Zr0.2Ti0.8)O3—0.5 (Ba0.7Ca0.3)TiO3 (BZT—BCT) thin films deposited on platinized sapphire and multistep-annealed at ... 850 ◦C are reported. The crack-free 680 nm thick BZT—BCT films with an average lateral grain size of 140 nm exhibit preferential {111} orientation on the surface confirmed by the electron backscatter diffraction (EBSD). Transmission Kikuchi diffraction (TKD) analysis reveals the evolution of preferential {111} and {110} orientation of columnar grains along the film thickness, that is, in the grain-growth direction. The formation of pores at the interface of the film and substrate is observed and related to the migration of pores and grain boundaries. The dielectric permittivity and losses of 840 and 0.02, respectively, at 1 kHz, are measured at room temperature. The maximum polarization and strain at an electric field of 1.2 MV•cm− 1 are about 32 μC•cm− 2 and 0.35 %, respectively. The piezoelectric d33 coefficient of 42 pm•V− 1 was measured by double-beam laser interferometry.
    Vir: Journal of alloys and compounds [Elektronski vir]. - ISSN 1873-4669 (Vol. 1047, [article no.] 185124, Dec. 2025, str. 1-7)
    Vrsta gradiva - e-članek ; neleposlovje za odrasle
    Leto - 2025
    Jezik - angleški
    COBISS.SI-ID - 258844675

    Povezava(-e):

    https://www.sciencedirect.com/science/article/pii/S0925838825066885?via%3Dihub
    DiRROS - Digitalni repozitorij raziskovalnih organizacij Slovenije
    DOI

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